Product information:

HG-ES spectroellipsometer

(two application options for PV / scientific research)

HG-ES spectroellipsometer is a high-performance spectroellipsometer launched in the field of photovoltaic solar cell R & D and quality control.

HG-ES spectroellipsometer is used to measure and analyze the layer structure parameters (such as thickness) and physical parameters (such as refractive index n and extinction coefficient K) of multilayer nano films in the photovoltaic field. Typical samples include single-layer antireflection films (such as SiNx, Si02, Ti02, A1203, etc.) and multilayer antireflection films (such as SiNx / Si02, sinx2 / sinx1, SiNx / A1203, etc.) on suede single crystal and polycrystalline solar cells, And multilayer nano films in thin film solar cells.

characteristic:

Highly sensitive measurement of rough suede nano films

Detection of multilayer antireflection film on crystalline silicon

Second level fast measurement

One touch instrument operation

High quality phase compensation

Xenon lamp light source intensity optimization system

Depolarization correction

Automatic variable incident angle

Back illuminated CCD spectrum acquisition system

Automatic XYZ stage, vacuum adsorption

Application:

The application of hg-es spectroellipsometer covers the single-layer and multi-layer nano films on the smooth substrate measured by the traditional spectroellipsometer. Typical applications include semiconductors (such as dielectric film, metal film, polymer, photoresist, silicon, PZT film, laser diodes Gan and AlGaN, transparent electronic devices, etc.) and flat panel display

(TFT, 0led, plasma display panel, flexible display panel, etc.), functional coatings: (antireflective, self-cleaning, electrochromic, specular optical coatings, polymer, oil, A1203 surface coating and treatment, etc.), biological and Chemical Engineering (organic film, LB film, Sam film, protein sub molecular layer, film adsorption, surface modification treatment, liquid, etc.).